Performance Degradation of Emerging PV Module Technologies Subjected to Extended Thermal Cycling
The reliability of photovoltaic (PV) modules in extreme desert environments, such as those in the United Arab Emirates, is critical for long-term energy production, given the challenges posed by intense thermal stress, soiling, sandstorms, and high ultraviolet exposure. This study investigates the degradation and reliability of three emerging PV technologies— Interdigitated Back Contact (IBC), Tunnel Oxide Passivated Contact (TopCon), and Passivated Emitter and Rear Cell (PERC)—under extended thermal cycling (TC) conditions. Building upon prior work limited to 200 TC cycles, this research extends testing to 400 cycles, simulating harsher, long-term thermal stresses encountered in desert climates.PV modules were subjected to temperature variations between -40°C and 85°C with a 10-minute soak time at extremes. Performance metrics, including electrical characteristics (Isc, Voc, Pmax, and fill factor) and electroluminescence imaging, were evaluated at baseline, 200, and 400 cycles. Results demonstrated distinct degradation trends across technologies. IBC modules exhibited strong resilience, with minimal power losses (<1%) and limited physical defects. TopCon modules displayed notable vulnerabilities on the rear side, with a 2.03% power loss and increased microcracks, suggesting the need for enhanced rear-side durability. PERC modules showed significant degradation, particularly on the front side, with power losses of 1.73%, highlighting challenges in maintaining robustness under extended thermal cycling.
Authors
- Ahmad Alheloo
- Vivian Alberts
- Hebatalla Alhamadani
- Yogesh Kumar
- Baloji Adothu (ORCID: https://orcid.org/0000-0002-6388-5163)
- Shaikha Hassan
- Prashanth Gabbadi
- Ahmed Alhammadi
Institutions
- Dubai Health Authority (AE)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.1109/pvsc59419.2025.11132098
- Primary Topic
- Photovoltaic System Optimization Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00