Accurate, precise pressure sensing with tethered optomechanics
We show that optomechanical pressure sensors with characterized density and thickness can achieve uncertainty as low as $1.1\phantom{\rule{0.1em}{0ex}}\mathrm{%}$ via comparison with a secondary pressure standard. The agreement between the secondary standard and our optomechanical sensors is a necessary step toward using optomechanical devices as primary pressure sensors. Our silicon nitride and silicon carbide sensors are short-term and long-term stable, displaying Allan deviations compatible with better than $1\phantom{\rule{0.1em}{0ex}}\mathrm{%}$ precision and baseline drift significantly lower than the secondary standard. Our measurements also yield the in situ thin-film density of our sensors with $1\phantom{\rule{0.1em}{0ex}}\mathrm{%}$ total uncertainty or lower, aiding development of other optomechanical sensors. Our results demonstrate that optomechanical pressure sensors can achieve accuracy, precision, and drift sufficient to replace high-performance legacy pressure gauges.
Authors
- John Lawall (ORCID: https://orcid.org/0000-0003-3368-4253)
- O.R. Green
- Jason J. Gorman (ORCID: https://orcid.org/0000-0003-2148-2312)
- Daniel S. Barker (ORCID: https://orcid.org/0000-0002-4614-5833)
- Yiliang Bao (ORCID: https://orcid.org/0000-0002-2384-747X)
Institutions
- National Institute of Standards and Technology (US)
- National Institute of Standards (EG)
Publication Details
- Journal
- Physical Review Applied
- Published
- 2025-08-28
- DOI
- https://doi.org/10.1103/9dtb-sk2j
- Primary Topic
- Mechanical and Optical Resonators
- Type
- article
- Field-Weighted Citation Impact
- 0.00