Development of a Nanosecond-Level High-Voltage Bipolar Square Wave Generator for Insulation Testing of SiC Device Packaging

Aiming at the insulation testing requirements for high-voltage silicon carbide (SiC) device packaging under bipolar square wave voltage conditions, this article proposes and develops a novel nanosecond-level high-voltage bipolar square wave generator based on cascaded half-bridge submodules. Under a typical capacitive load, the generator achieves a peak-to-peak voltage of 10kV, an adjustable repetition frequency from dc to 50kHz, and a duty cycle ranging from 0% to 100%, with a rise time compressed to approximately 39ns. By combining a series-isolated power supply design with common-mode filtering, the proposed approach significantly reduces common-mode interference under high <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dv</i>/<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dt</i> conditions, ensuring high-voltage isolation of the driver stage and improves electromagnetic compatibility. Compared with traditional pulse topologies such as Blumlein lines, linear transformer drivers (LTDs), and Marx generators, the proposed generator excels in flat-top waveform quality, flexible pulsewidth/duty-cycle modulation, and nanosecond-level rising edges. It thus provides a more precise and reliable experimental platform for investigating partial discharge and insulation-aging mechanisms in high-voltage SiC devices.

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Publication Details

Journal
IEEE Transactions on Plasma Science
Published
2025-08-26
DOI
https://doi.org/10.1109/tps.2025.3597654
Primary Topic
Semiconductor Lasers and Optical Devices
Type
article
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article

Development of a Nanosecond-Level High-Voltage Bipolar Square Wave Generator for Insulation Testing of SiC Device Packaging

Zhibin Zhao, Rui Jin, Yan Pan, Xuebao Li et al.
IEEE Transactions on Plasma Science
Semiconductor Lasers and Optical Devices
article

Development of a Nanosecond-Level High-Voltage Bipolar Square Wave Generator for Insulation Testing of SiC Device Packaging

Zhibin Zhao, Rui Jin, Yan Pan, Xuebao Li, Hao Yan
article en

Abstract

Aiming at the insulation testing requirements for high-voltage silicon carbide (SiC) device packaging under bipolar square wave voltage conditions, this article proposes and develops a novel nanosecond-level high-voltage bipolar square wave generator based on cascaded half-bridge submodules. Under a typical capacitive load, the generator achieves a peak-to-peak voltage of 10kV, an adjustable repetition frequency from dc to 50kHz, and a duty cycle ranging from 0% to 100%, with a rise time compressed to approximately 39ns. By combining a series-isolated power supply design with common-mode filtering, the proposed approach significantly reduces common-mode interference under high <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dv</i>/<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dt</i> conditions, ensuring high-voltage isolation of the driver stage and improves electromagnetic compatibility. Compared with traditional pulse topologies such as Blumlein lines, linear transformer drivers (LTDs), and Marx generators, the proposed generator excels in flat-top waveform quality, flexible pulsewidth/duty-cycle modulation, and nanosecond-level rising edges. It thus provides a more precise and reliable experimental platform for investigating partial discharge and insulation-aging mechanisms in high-voltage SiC devices.

IEEE Transactions on Plasma ScienceVol. 53(9)
North China Electric Power University (CN), Beijing Solar Energy Research Institute (CN)
Affordable and clean energy
Openalex Percentile: Top 79%
Semiconductor Lasers and Optical Devices
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Development of a Nanosecond-Level High-Voltage Bipolar Square Wave Generator for Insulation Testing of SiC Device Packaging — Zhibin Zhao, Rui Jin, et al. · IEEE Transactions on Plasma Science (2025) | TGRS Research Map | TGRS