Zero-Sequence Current Retrieval-Based Robust High-Impedance Fault Location in Resonant Grounding System

To address the limited accuracy and robustness of existing high-impedance fault (HIF) location methods for resonant grounding systems (RGS), which fail to account for the difference in prominence and fluctuations of transient component (TC) at various measurement points under different fault scenarios, this paper introduces a robust HIF location method that eliminates the high requirement for TC extraction. By analyzing the equivalent circuit equations of HIF, the influence mechanism of grounding resistance and the ratio of zero-sequence capacitance upstream of the measurement position to the entire zero sequency system on the differences in main TC is quantitatively analyzed. Meanwhile, a zero-sequence current (ZSC) retrieval model is constructed to classify signals from faulty and healthy regions into ideal separable data unaffected by line parameter deviation and fault conditions. Subsequently, a fault location method via shape-based distance metric is developed to ensure accurate and robust fault feeder selection and fault section location. Finally, extensive case studies validate the effectiveness of the proposed method under different scenarios.

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Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3602550
Primary Topic
Engineering and Test Systems
Type
article
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article

Zero-Sequence Current Retrieval-Based Robust High-Impedance Fault Location in Resonant Grounding System

Zhenyuan Zhang, Wei‐Jen Lee, Jie Ren, Shi Jing
IEEE Transactions on Instrumentation and Measurement
Engineering and Test Systems
article

Zero-Sequence Current Retrieval-Based Robust High-Impedance Fault Location in Resonant Grounding System

Zhenyuan Zhang, Wei‐Jen Lee, Jie Ren, Shi Jing
article en

Abstract

To address the limited accuracy and robustness of existing high-impedance fault (HIF) location methods for resonant grounding systems (RGS), which fail to account for the difference in prominence and fluctuations of transient component (TC) at various measurement points under different fault scenarios, this paper introduces a robust HIF location method that eliminates the high requirement for TC extraction. By analyzing the equivalent circuit equations of HIF, the influence mechanism of grounding resistance and the ratio of zero-sequence capacitance upstream of the measurement position to the entire zero sequency system on the differences in main TC is quantitatively analyzed. Meanwhile, a zero-sequence current (ZSC) retrieval model is constructed to classify signals from faulty and healthy regions into ideal separable data unaffected by line parameter deviation and fault conditions. Subsequently, a fault location method via shape-based distance metric is developed to ensure accurate and robust fault feeder selection and fault section location. Finally, extensive case studies validate the effectiveness of the proposed method under different scenarios.

IEEE Transactions on Instrumentation and MeasurementVol. 74
University of Electronic Science and Technology of China (CN), The University of Texas at Arlington (US)
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Engineering and Test Systems
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Zero-Sequence Current Retrieval-Based Robust High-Impedance Fault Location in Resonant Grounding System — Zhenyuan Zhang, Wei‐Jen Lee, et al. · IEEE Transactions on Instrumentation and Measurement (2025) | TGRS Research Map | TGRS