Channel-Type Engineering in an InSe-Based Transistor: Paving a Way for Next-Generation Reconfigurable Electronics

Achieving reversible n/p-type switching in two-dimensional semiconductors is crucial for reconfigurable nanoelectronic devices. Here, we demonstrate a fully reversible channel-type conversion in InSe-based transistors via ultraviolet-ozone oxidation and thermal annealing, enabling stable bidirectional polarity switching. Electrical, spectroscopic, and microscopic analyses reveal that the reversible-type conversion originates from the intercalation and elimination of oxygen in layered InSe. Density functional theory confirms that oxygen intercalation introduces electron states above the valence band maximum, leading to p-type conduction. Furthermore, an InSe-based inverter and complementary logic gates ("NAND" and "NOR") were fabricated. Finally, an InSe-based p-n homojunction exhibits a high forward-to-reverse current ratio (<i>I</i><sub>F</sub>/<i>I</i><sub>R</sub> > 10<sup>6</sup>) and self-powered photodetection with specific detectivity above 10<sup>12</sup> Jones. This work provides a fundamental demonstration of reversible channel-type engineering in layered semiconductors, offering potential pathways for future developments in reconfigurable electronics.

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Publication Details

Journal
Nano Letters
Published
2025-08-25
DOI
https://doi.org/10.1021/acs.nanolett.5c03444
Citations
2
Primary Topic
Advanced Memory and Neural Computing
Type
article
Field-Weighted Citation Impact
1.46

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article

Channel-Type Engineering in an InSe-Based Transistor: Paving a Way for Next-Generation Reconfigurable Electronics

Jing Cheng, Liyan Shang, Zhaotan Gao, Hongzhi Guo et al.
2 citations
Nano Letters
Advanced Memory and Neural Computing
1.46
article

Channel-Type Engineering in an InSe-Based Transistor: Paving a Way for Next-Generation Reconfigurable Electronics

Jing Cheng, Liyan Shang, Zhaotan Gao, Hongzhi Guo, Jinzhong Zhang, Zhigao Hu, Minqian Mao, Shijing Gong, Junhao Chu, Zian Hong, Ruiqi Jiang, Mengjiao Li, Z. Li, Zhi Yuan Cheng
article en
2 citations

Abstract

Achieving reversible n/p-type switching in two-dimensional semiconductors is crucial for reconfigurable nanoelectronic devices. Here, we demonstrate a fully reversible channel-type conversion in InSe-based transistors via ultraviolet-ozone oxidation and thermal annealing, enabling stable bidirectional polarity switching. Electrical, spectroscopic, and microscopic analyses reveal that the reversible-type conversion originates from the intercalation and elimination of oxygen in layered InSe. Density functional theory confirms that oxygen intercalation introduces electron states above the valence band maximum, leading to p-type conduction. Furthermore, an InSe-based inverter and complementary logic gates ("NAND" and "NOR") were fabricated. Finally, an InSe-based p-n homojunction exhibits a high forward-to-reverse current ratio (<i>I</i><sub>F</sub>/<i>I</i><sub>R</sub> > 10<sup>6</sup>) and self-powered photodetection with specific detectivity above 10<sup>12</sup> Jones. This work provides a fundamental demonstration of reversible channel-type engineering in layered semiconductors, offering potential pathways for future developments in reconfigurable electronics.

Nano LettersVol. 25(36)
Shanghai University (CN), Shanxi University (CN), NeoPhotonics (United States) (US), Shanghai Institute of Technical Physics (CN), Shanxi University of Traditional Chinese Medicine (CN), Infrared Laboratories (United States) (US), State Key Laboratory of Infrared Physics, East China Normal University (CN)
National Natural Science Foundation of China, Science and Technology Commission of Shanghai Municipality, East China Normal University, Natural Science Foundation of Henan Province, Nanyang Institute of Technology, National Key Research and Development Program of China, Key Scientific Research Project of Colleges and Universities in Henan Province
Affordable and clean energy
Openalex Percentile: Top 15%
Advanced Memory and Neural Computing
1.46
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