Enhancing FDS Low-Frequency Micro-Current Measurement: A Lock-in Amplification Approach with High Precision
To address the challenges of weak current signals in low-frequency band (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$1 \text{mHz}-1 ~\text{Hz}$</tex>) during Frequency Domain Spectroscopy (FDS) testing, where on-site measurements are susceptible to electromagnetic interference and effective data acquisition is difficult, this paper proposes a micro-current detection technology based on phase-sensitive detection (PSD), and demodulation algorithm. By integrating digital signal processing techniques such as narrowband filtering and timedomain sinusoidal fitting, the method achieves ultra-lowfrequency <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$n A$</tex>-level current measurements under complex background noise. First, the characteristics of low-frequency current signals of oil-paper insulated bushing are analyzed. Experimental validation on a 40 kV oil-paper insulated bushing sample demonstrates that the proposed approach enables rapid measurement of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$n A$</tex>-level currents in the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$1 \text{mHz}-1 ~\text{Hz}$</tex> range while maintaining a phase resolution on the order of 0.005°, with excellent reproducibility and stability in repeated measurements.
Authors
- Chuanhui Cheng
- Ran Zhuo (ORCID: https://orcid.org/0000-0003-4546-1719)
- Xipeng Chen (ORCID: https://orcid.org/0000-0002-8739-3083)
- Yan Luo (ORCID: https://orcid.org/0000-0002-5919-1329)
- Zixin Wang (ORCID: https://orcid.org/0000-0001-9711-2241)
- Zhiming Huang (ORCID: https://orcid.org/0000-0002-2533-1717)
- Ke Fan (ORCID: https://orcid.org/0000-0002-4841-1138)
Institutions
- Electric Power Research Institute (US)
- Sun Yat-sen University (CN)
Publication Details
- Published
- 2025-08-03
- DOI
- https://doi.org/10.1109/icempe66159.2025.11123115
- Primary Topic
- Advanced Electrical Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00