Simplified Analytical Loss Analysis for Early Exclusion of Unsuitable MOSFET Candidates

In this paper a modular early selection methodology for MOSFETs is presented and demonstrated. It purposefully does not require specialized software and utilizes datasheet values to make it scalable. The goal of this methodology is to reduce the amount of MOSFET candidates to the most promising ones which can than be further scrutinized. The proposed methodology is applied to three real world applications to demonstrate their utility.