Recent progress in the application of qPlus-type non-contact atomic force microscopy in surface structure analysis

Authors

Zhonghua Zhu (ORCID: https://orcid.org/0000-0003-2144-8093)
Xiong Zhou (ORCID: https://orcid.org/0000-0002-8990-5783)
Changlin Li (ORCID: https://orcid.org/0009-0007-8208-4517)
Kai Wu (ORCID: https://orcid.org/0000-0001-6336-7836)
Weijun Guo (ORCID: https://orcid.org/0000-0003-0280-761X)
Jinliang Pan

Publication Details

Journal: Scientia Sinica Chimica
Published: 2025-08-25
DOI: https://doi.org/10.1360/ssc-2025-0204
Primary Topic: Force Microscopy Techniques and Applications
Type: article
Field-Weighted Citation Impact: 0.00

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article

Recent progress in the application of qPlus-type non-contact atomic force microscopy in surface structure analysis

Zhonghua Zhu, Xiong Zhou, Changlin Li, Kai Wu et al.

Aug 25, 2025

Scientia Sinica Chimica

Force Microscopy Techniques and Applications

article

Recent progress in the application of qPlus-type non-contact atomic force microscopy in surface structure analysis

Zhonghua Zhu, Xiong Zhou, Changlin Li, Kai Wu, Weijun Guo, Jinliang Pan

August 25, 2025article en

Abstract

No abstract available for this paper.

Scientia Sinica ChimicaVol. 56(1)

Openalex Percentile: Top 83%

Force Microscopy Techniques and Applications

DOI Open Access PDF OpenAlex

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Recent progress in the application of qPlus-type non-contact atomic force microscopy in surface structure analysis — Zhonghua Zhu, Xiong Zhou, et al. · Scientia Sinica Chimica (2025) | TGRS Research Map | TGRS