Suppression of step bunching in graphene growth on 4° off-axis SiC (0001) by a two-step growth technique

Step bunching during graphene growth on 4° off-axis SiC (0001) was effectively suppressed using a two-step growth technique. In the first step, a graphene buffer layer was obtained under vacuum. In the following step, additional graphene layers were grown under an argon atmosphere at atmospheric pressure, with good control over the number of layers. The first-step layer played a key role in suppressing step bunching during the second step, resulting in a one-order-of-magnitude reduction in surface roughness compared to a conventional growth method exclusively using an argon atmosphere. The effect of the off-angle on step bunching was also investigated by analyzing the differences between on-axis and 4° off-axis substrates. Our findings suggest that atomic diffusion is restricted by the presence of the graphene buffer layer.

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Publication Details

Journal
Applied Physics Letters
Published
2025-08-25
DOI
https://doi.org/10.1063/5.0283559
Primary Topic
Graphene research and applications
Type
article
Field-Weighted Citation Impact
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article

Suppression of step bunching in graphene growth on 4° off-axis SiC (0001) by a two-step growth technique

Ken Nakahara, Wataru Norimatsu, Keiju Sato, Takuji Maekawa et al.
Applied Physics Letters
Graphene research and applications
article

Suppression of step bunching in graphene growth on 4° off-axis SiC (0001) by a two-step growth technique

Ken Nakahara, Wataru Norimatsu, Keiju Sato, Takuji Maekawa, Yoshiaki Oku
article en

Abstract

Step bunching during graphene growth on 4° off-axis SiC (0001) was effectively suppressed using a two-step growth technique. In the first step, a graphene buffer layer was obtained under vacuum. In the following step, additional graphene layers were grown under an argon atmosphere at atmospheric pressure, with good control over the number of layers. The first-step layer played a key role in suppressing step bunching during the second step, resulting in a one-order-of-magnitude reduction in surface roughness compared to a conventional growth method exclusively using an argon atmosphere. The effect of the off-angle on step bunching was also investigated by analyzing the differences between on-axis and 4° off-axis substrates. Our findings suggest that atomic diffusion is restricted by the presence of the graphene buffer layer.

Applied Physics LettersVol. 127(8)
Waseda University (JP), ROHM (JP)
Openalex Percentile: Top 84%
Graphene research and applications
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