Extended depth of focus metalens toward the entire long-wave infrared spectrum through inverse design framework
We present an inverse design framework for long-wave infrared (LWIR) extended depth of focus (EDOF) metalenses, integrating angular spectrum theory and genetic algorithm optimization with phase encoding. This approach achieves a 7.2× depth of field (DOF) enhancement and near-diffraction-limited performance compared to conventional metalenses. By balancing EDOF functionality and broadband operation, the optimized metalens maintains imaging fidelity with 65% confocal overlap across the LWIR spectrum, featuring spatially consistent point spread functions (PSFs) and uniform focal spot distributions. This work establishes a scalable methodology for multifunctional metasurface engineering, offering transformative potential for advanced LWIR imaging systems.
Authors
- Mingjie Wu
- Fen Zhao (ORCID: https://orcid.org/0009-0006-4349-4380)
- Fengyuan Gan (ORCID: https://orcid.org/0000-0002-3746-4189)
- Junbo Yang (ORCID: https://orcid.org/0000-0003-1093-5611)
- Jiagui Wu (ORCID: https://orcid.org/0000-0003-2743-5162)
- Siyang Xiao (ORCID: https://orcid.org/0000-0003-0658-0811)
- X. Ge (ORCID: https://orcid.org/0009-0009-9956-2532)
- YongCan Zeng
- Yuqing Zhang (ORCID: https://orcid.org/0000-0001-9915-463X)
- ran chongchong
Institutions
- Southwest University (CN)
- University of Shanghai for Science and Technology (CN)
Publication Details
- Journal
- Optics Express
- Published
- 2025-08-25
- DOI
- https://doi.org/10.1364/oe.570816
- Citations
- 1
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 1.26