257-nm AlGaN-Based Deep Ultraviolet Light-Emitting Diodes With Thin Quantum Wells to Achieve Large −3 dB Bandwidth
In this work, an AlGaN-based deep ultraviolet light-emitting diode (DUV LED) with ultra-thin quantum wells has been proposed to improve the −3dB bandwidth for the potential use in non-line-of-sight communication. Simulation results demonstrate that the ultra-thin quantum well structure effectively suppresses the quantum-confined Stark effect (QCSE), promotes uniform hole distribution and radiative recombination. Consequently, this results in shortened radiative recombination lifetime <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$(\tau _{\textit {ra}{d}})$ </tex-math></inline-formula>, which generates a high −3 dB modulation bandwidth of 194 MHz and maintains a signal-to-noise ratio (SNR) above 10 dB in the low-frequency regime for <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$350~\mu $ </tex-math></inline-formula>m <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\times 350~\mu $ </tex-math></inline-formula>m DUV LED. Moreover, the fabricated devices exhibit a low leakage current of less than 10 nA at the reverse bias of −5 V, indicating that leakage paths caused by mesa sidewall defects are significantly reduced.
Authors
- Zhijian Pei (ORCID: https://orcid.org/0000-0003-2280-4694)
- Xiao Wei Sun (ORCID: https://orcid.org/0000-0002-2840-1880)
- Chunshuang Chu (ORCID: https://orcid.org/0000-0001-8303-9434)
- Yonghui Zhang (ORCID: https://orcid.org/0000-0003-1207-4851)
- Pengfei Tian (ORCID: https://orcid.org/0000-0001-8479-2727)
- Fuping Huang (ORCID: https://orcid.org/0009-0007-3679-8447)
- Zi‐Hui Zhang (ORCID: https://orcid.org/0000-0003-0638-1118)
- Kangkai Tian (ORCID: https://orcid.org/0000-0002-2464-5482)
Institutions
- Guangdong University of Technology (CN)
- Hebei University of Technology (CN)
- Fudan University (CN)
- Southern University of Science and Technology (CN)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2025-08-14
- DOI
- https://doi.org/10.1109/led.2025.3598775
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- National Key Research and Development Program of China