Curvature-adaptive gigapixel microscopy at submicron resolution and centimeter scale
Large-area microscopy with submicron resolution is limited by tradeoffs between field of view (FOV), resolution, and imaging speed. Samples are rarely flat across centimeter-scale FOV, which often requires existing solutions to use mechanical scanning to ensure focused capture at reduced throughput. Here, we present PANORAMA, a single-shot, re-imaging microscope that achieves seamless, gigapixel imaging over a 16.3 × 18.8 mm<sup>2</sup> FOV at 0.84 µm half-pitch resolution without mechanical scanning. By using a telecentric photolithography lens, a large-aperture tube lens, and a flat micro-camera array with adaptive per-camera focus control, PANORAMA maintains submicron focus across flat, curved, or uneven samples that span centimeters. This approach improves imaging throughput and adaptability, enabling gigapixel multi-modal microscopy of large flat and non-flat samples in one shot, thus broadening its applications in biomedical and materials imaging.
Authors
- Lucas Kreiß (ORCID: https://orcid.org/0000-0002-7749-0015)
- Mark Harfouche (ORCID: https://orcid.org/0000-0002-4657-4603)
- Clare Cook (ORCID: https://orcid.org/0000-0001-8832-5149)
- Martin O. Bohlen (ORCID: https://orcid.org/0000-0001-6522-146X)
- Roarke Horstmeyer (ORCID: https://orcid.org/0000-0002-2480-9141)
- Haitao Chen (ORCID: https://orcid.org/0000-0001-6730-0989)
- Xi Yang (ORCID: https://orcid.org/0009-0007-4874-7831)
- Genevieve M. Kuczewski
Institutions
- Duke University (US)
- Optics Technology (United States) (US)
Publication Details
- Journal
- Optics Letters
- Published
- 2025-08-15
- DOI
- https://doi.org/10.1364/ol.572466
- Citations
- 3
- Primary Topic
- Image Processing Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 3.41