Design and reliability verification of an automated testing system for high-speed optical transceiver modules

With the rapid development of AI-driven intelligent data centers, the demand for 400Gb/s and 800Gb/s high-speed optical modules has surged. However, their performance and reliability testing faces challenges such as high costs and low efficiency. This paper proposes a transceiver-integrated automated testing system for PAM4 high-speed optical transceiver modules. By leveraging self-loopback technology to reuse the optical signals from the transmitter of the module and integrating optical switches for multi-channel automatic switching, the system significantly simplifies the testing process and improves efficiency. Additionally, a modular aging test system was developed by retrofitting traditional temperature-humidity chambers. This system supports parallel testing of multiple modules and adapts to various packaging types, enabling reliability evaluation under extreme environmental conditions. Experimental results demonstrate that the variation in key parameters of 400G QSFP112 DR4 optical modules samples remained below 1dB after high-temperature lifespan tests and damp heat tests, complying with IEEE 802.3df standard requirements, thereby validating the system's effectiveness and practicality.