A 3-DOF space microvibration measurement method based on geometric optics
This paper introduces a novel micro-vibration measurement method applied to space environment based on geometrical optics, in which the position of the light spots reflected from a suspended test mass is measured with three position-sensitive detectors(PSD) and then three-degrees-of-freedom displacement of the test mass and micro-vibration is derived. We build a theoretical model of the method and constructed a micro-vibration accelerometer based on the method. We characterize the accelerometer and demonstrate it in micro-vibration environment provided by a drop tower driven by an electromagnetic launch system<sup>[1]</sup>. The accelerometer’s measurement noise is less than 5×10<sup>-5</sup>m/s<sup>2</sup>/Hz<sup>1/2</sup> at frequency band below 1Hz. In micro-vibration environment, the accelerometer performs better than a commercial quartz accelerometer (JN-06M) at frequency band below 1Hz. Since the accelerometer work stably at open-loop state in principle, it has great potential in long-term space micro-vibration measurement in space science experiments.
Authors
- Wenbo Dong (ORCID: https://orcid.org/0000-0002-0573-3903)
- Xianli Cui
- Xiaojing Ren (ORCID: https://orcid.org/0000-0002-0789-8015)
- Nan Li (ORCID: https://orcid.org/0000-0002-8248-9027)
- Yongkang Zhang (ORCID: https://orcid.org/0000-0002-4745-3176)
- Mengxi Yu (ORCID: https://orcid.org/0009-0008-6410-8842)
- Jianguo He
- Bing Li (ORCID: https://orcid.org/0000-0002-5888-6735)
- J.Z. Bai (ORCID: https://orcid.org/0009-0005-5263-1749)
- Jiancheng Liu (ORCID: https://orcid.org/0000-0002-9044-6107)
- Jiaqi Yu (ORCID: https://orcid.org/0000-0002-9953-7873)
- Zhe Wang (ORCID: https://orcid.org/0009-0002-3397-0938)
Institutions
- Chinese Academy of Sciences (CN)
- Technology and Engineering Center for Space Utilization (CN)
- Aerospace Information Research Institute (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Published
- 2025-08-15
- DOI
- https://doi.org/10.1117/12.3071864
- Primary Topic
- Advanced MEMS and NEMS Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00