Fundamental Limits on Ultrafast Electron Holography

The ultrafast transmission electron microscope (UTEM) enables imaging of dynamical phenomena down to the femtosecond temporal regime, with sub-nanometer spatial resolution [1]. Techniques like photon-induced nearfield electron microscopy (PINEM) provide access to the dynamics of optical excitations such as photons, plasmons, and phonon-polaritons, by relying on the inelastic interaction of electrons with the optical fields.

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Published
2025-06-23
DOI
https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109684
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
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Fundamental Limits on Ultrafast Electron Holography

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article en

Abstract

The ultrafast transmission electron microscope (UTEM) enables imaging of dynamical phenomena down to the femtosecond temporal regime, with sub-nanometer spatial resolution [1]. Techniques like photon-induced nearfield electron microscopy (PINEM) provide access to the dynamics of optical excitations such as photons, plasmons, and phonon-polaritons, by relying on the inelastic interaction of electrons with the optical fields.

Technion – Israel Institute of Technology (IL), Ernst Ruska Centre (DE), Eindhoven University of Technology (NL)
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Advanced Electron Microscopy Techniques and Applications
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