Compressive Photoluminescence Tomography via 3D Structured Light: Limits of the Method

Photoluminescence (PL) imaging is widely used in various fields, including materials research. For instance, defects in optical materials can be effectively identified by analyzing their PL spectra [1]. However, the weak PL of these defects often makes sample mapping highly time-consuming-typically taking tens of minutes. Extending this approach to three-dimensional PL tomography would therefore be prohibitively long. Nevertheless, gaining information about the distribution of specific defects beneath the surface is an enabling technique for efficiently studying defects induced during the grinding and polishing of optical elements.