High-Speed Computational Imaging With Path-Corrected Fly-Scan Ptychography

Ptychography is a computational imaging technique that enables the reconstruction of the amplitude and phase of an object and an illumination field using a series of recorded diffraction patterns [1]. Compared to conventional imaging techniques, ptychographic measurements offer more comprehensive information about the reconstructed object without requiring high-quality lenses, while also accommodating correction of experimental imperfections such as distance inaccuracies, angular misalignments, and other experimental errors. However, as ptychography is not a single-shot measurement technique, it is time-consuming, with a significant part of the measurement time attributed to the scanning process. Such mechanical scanning is inherently slow due to the acceleration limitations of the sample stage and the time reauired for stabilization [2].

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Published
2025-06-23
DOI
https://doi.org/10.1109/cleo/europe-eqec65582.2025.11109582
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

High-Speed Computational Imaging With Path-Corrected Fly-Scan Ptychography

Jacob Seifert, Avelino Mas Sánchez, Matthias Gouder, Stefan Witte et al.
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Advanced X-ray Imaging Techniques
article

High-Speed Computational Imaging With Path-Corrected Fly-Scan Ptychography

Jacob Seifert, Avelino Mas Sánchez, Matthias Gouder, Stefan Witte, Augustas Karpavičius
article en

Abstract

Ptychography is a computational imaging technique that enables the reconstruction of the amplitude and phase of an object and an illumination field using a series of recorded diffraction patterns [1]. Compared to conventional imaging techniques, ptychographic measurements offer more comprehensive information about the reconstructed object without requiring high-quality lenses, while also accommodating correction of experimental imperfections such as distance inaccuracies, angular misalignments, and other experimental errors. However, as ptychography is not a single-shot measurement technique, it is time-consuming, with a significant part of the measurement time attributed to the scanning process. Such mechanical scanning is inherently slow due to the acceleration limitations of the sample stage and the time reauired for stabilization [2].

Advanced Research Center for Nanolithography (Netherlands) (NL)
Openalex Percentile: Top 71%
Advanced X-ray Imaging Techniques
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