Precision Enhancement with Bright Kerr Amplitude-Squeezed Light for Static-Loss Microscopy

For absorption imaging, optical noise is a limitation [1]. Photon counting experiments using correlated photon pair sources can achieve sub-shot noise imaging but are not scalable to high brightness [2]. While lowering the noise floor increases the signal-to-noise ratio without increasing the signal's power, enhancing the precision reduces the variance of estimates. In imaging, improved precision can lead to higher contrast images, allowing regions with similar values to be more easily distinguished due to smaller error bars [2].

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Published
2025-06-23
DOI
https://doi.org/10.1109/cleo/europe-eqec65582.2025.11110980
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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article

Precision Enhancement with Bright Kerr Amplitude-Squeezed Light for Static-Loss Microscopy

Cyril Torre, G. S. Atkinson, Oliver Green, Jonathan C. F. Matthews et al.
Integrated Circuits and Semiconductor Failure Analysis
article

Precision Enhancement with Bright Kerr Amplitude-Squeezed Light for Static-Loss Microscopy

Cyril Torre, G. S. Atkinson, Oliver Green, Jonathan C. F. Matthews, Rachel N. Clark, Giacomo Ferranti, Alex McMillan, John Rarity
article en

Abstract

For absorption imaging, optical noise is a limitation [1]. Photon counting experiments using correlated photon pair sources can achieve sub-shot noise imaging but are not scalable to high brightness [2]. While lowering the noise floor increases the signal-to-noise ratio without increasing the signal's power, enhancing the precision reduces the variance of estimates. In imaging, improved precision can lead to higher contrast images, allowing regions with similar values to be more easily distinguished due to smaller error bars [2].

University of Bristol (GB), Bristol Robotics Laboratory (GB)
Affordable and clean energy
Openalex Percentile: Top 79%
Integrated Circuits and Semiconductor Failure Analysis
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Precision Enhancement with Bright Kerr Amplitude-Squeezed Light for Static-Loss Microscopy — Cyril Torre, G. S. Atkinson, et al. · (2025) | TGRS Research Map | TGRS