Channel material impact on HEMT performance: insights from GaN, AlGaN, and InGaN

Abstract Three HEMT designs—Al 0.3 Ga 0.7 N/GaN, Al 0.3 Ga 0.7 N/Al 0.11 Ga 0.89 N, and Al 0.3 Ga 0.7 N/In 0.11 Ga 0.89 N HEMTs—are numerically examined in this study. The designs vary based on the channel material. The study delves into various aspects such as conduction band profile, electric field distribution, electron concentration, drain and transfer curves along with transconductance profiles, higher order transconductances, figure of merits ( <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">VIP</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">2</mml:mn> </mml:mrow> </mml:msub> </mml:math> , <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">VIP</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">3</mml:mn> </mml:mrow> </mml:msub> </mml:math> , <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">IIP</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">3</mml:mn> </mml:mrow> </mml:msub> </mml:math> , <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">IMD</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">3</mml:mn> </mml:mrow> </mml:msub> </mml:math> ), and breakdown voltage characteristics of these three HEMT designs. The results indicate that InGaN channel-based HEMTs provide superior 2DEG confinement, greater peak electron concentration, higher maximum drain saturation current, and maximum transconductance among the three HEMT configurations. The maximum saturated drain current densities for Al 0.3 Ga 0.7 N/Al 0.11 Ga 0.89 N HEMT, Al 0.3 Ga 0.7 N/GaN HEMT, and Al 0.3 Ga 0.7 N/ In 0.11 Ga 0.89 N HEMT are 0.34 A mm −1 , 0.89 A mm −1 , and 2.27 A mm −1 . Further, the linearity merits indicate that the InGaN channel HEMT exhibits superior linearity performance. In contrast, the breakdown characteristics show that AlGaN channel HEMT demonstrates a higher breakdown voltage (1501 V) necessary for high-voltage and high-temperature electronics. Consequently, each device is suited for specific applications.

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Publication Details

Journal
Engineering Research Express
Published
2025-08-22
DOI
https://doi.org/10.1088/2631-8695/adfeb7
Primary Topic
GaN-based semiconductor devices and materials
Type
article
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article

Channel material impact on HEMT performance: insights from GaN, AlGaN, and InGaN

Muhammad Usman, Wagma Hidayat
Engineering Research Express
GaN-based semiconductor devices and materials
article

Channel material impact on HEMT performance: insights from GaN, AlGaN, and InGaN

Muhammad Usman, Wagma Hidayat
article en

Abstract

Abstract Three HEMT designs—Al 0.3 Ga 0.7 N/GaN, Al 0.3 Ga 0.7 N/Al 0.11 Ga 0.89 N, and Al 0.3 Ga 0.7 N/In 0.11 Ga 0.89 N HEMTs—are numerically examined in this study. The designs vary based on the channel material. The study delves into various aspects such as conduction band profile, electric field distribution, electron concentration, drain and transfer curves along with transconductance profiles, higher order transconductances, figure of merits ( <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">VIP</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">2</mml:mn> </mml:mrow> </mml:msub> </mml:math> , <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">VIP</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">3</mml:mn> </mml:mrow> </mml:msub> </mml:math> , <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">IIP</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">3</mml:mn> </mml:mrow> </mml:msub> </mml:math> , <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mi mathvariant="bold-italic">IMD</mml:mi> </mml:mrow> <mml:mrow> <mml:mn mathvariant="bold-italic">3</mml:mn> </mml:mrow> </mml:msub> </mml:math> ), and breakdown voltage characteristics of these three HEMT designs. The results indicate that InGaN channel-based HEMTs provide superior 2DEG confinement, greater peak electron concentration, higher maximum drain saturation current, and maximum transconductance among the three HEMT configurations. The maximum saturated drain current densities for Al 0.3 Ga 0.7 N/Al 0.11 Ga 0.89 N HEMT, Al 0.3 Ga 0.7 N/GaN HEMT, and Al 0.3 Ga 0.7 N/ In 0.11 Ga 0.89 N HEMT are 0.34 A mm −1 , 0.89 A mm −1 , and 2.27 A mm −1 . Further, the linearity merits indicate that the InGaN channel HEMT exhibits superior linearity performance. In contrast, the breakdown characteristics show that AlGaN channel HEMT demonstrates a higher breakdown voltage (1501 V) necessary for high-voltage and high-temperature electronics. Consequently, each device is suited for specific applications.

Engineering Research ExpressVol. 7(3)
Ghulam Ishaq Khan Institute of Engineering Sciences and Technology (PK)
Openalex Percentile: Top 86%
GaN-based semiconductor devices and materials
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