Comparative Method Between Eddy Current and Optical Microscopy in the Determination of Thickness of 6063 Aluminum Alloy Anodization

This study compares the Eddy current technique and optical microscopy for measuring the anodized layer thickness in a 6063 aluminum alloy with the aim of establishing an efficient and accurate methodology capable of delivering optimal results in a time-efficient manner. Optical microscopy was used as the reference method, with five measurements taken in different fields for each specimen. The Eddy current method was applied using two calibration strategies: one calibration before each measurement and another after every ten specimens. The Bland–Altman analysis was employed to compare both measurement techniques. The results indicated that the calibration before each measurement strategy using Eddy current showed higher agreement with the reference method, suggesting that both techniques can be considered equivalent and interchangeable. Furthermore, the Eddy current method demonstrated significant advantages in detecting thickness variations along the specimen, revealing non-uniform distribution of the anodized layer. This method also proved to be faster and eliminated the need for metallographic preparation required by optical microscopy, thus significantly reducing analysis time and cost. In conclusion, the Eddy current method with calibration before each measurement strategy is proposed as an effective alternative for measuring anodized layer thickness in applications where speed and precision are critical.

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Publication Details

Journal
Applied Sciences
Published
2025-08-15
DOI
https://doi.org/10.3390/app15169025
Citations
1
Primary Topic
Anodic Oxide Films and Nanostructures
Type
article
Field-Weighted Citation Impact
0.52

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article

Comparative Method Between Eddy Current and Optical Microscopy in the Determination of Thickness of 6063 Aluminum Alloy Anodization

Miguel Ángel Baltazar-Zamora, María Lara-Banda, Demetrio Nieves-Mendoza, Ce Tochtli Méndez-Ramírez et al.
1 citations
Applied Sciences
Anodic Oxide Films and Nanostructures
0.52
article

Comparative Method Between Eddy Current and Optical Microscopy in the Determination of Thickness of 6063 Aluminum Alloy Anodization

Miguel Ángel Baltazar-Zamora, María Lara-Banda, Demetrio Nieves-Mendoza, Ce Tochtli Méndez-Ramírez, José Ángel Cabral Miramontes, Citlalli Gaona-Tiburcio, Erick Maldonado-Bandala, Facundo Almeraya-Calderón, Javier Olguín-Coca, Daniel Vera Cervantes
article en
1 citations

Abstract

This study compares the Eddy current technique and optical microscopy for measuring the anodized layer thickness in a 6063 aluminum alloy with the aim of establishing an efficient and accurate methodology capable of delivering optimal results in a time-efficient manner. Optical microscopy was used as the reference method, with five measurements taken in different fields for each specimen. The Eddy current method was applied using two calibration strategies: one calibration before each measurement and another after every ten specimens. The Bland–Altman analysis was employed to compare both measurement techniques. The results indicated that the calibration before each measurement strategy using Eddy current showed higher agreement with the reference method, suggesting that both techniques can be considered equivalent and interchangeable. Furthermore, the Eddy current method demonstrated significant advantages in detecting thickness variations along the specimen, revealing non-uniform distribution of the anodized layer. This method also proved to be faster and eliminated the need for metallographic preparation required by optical microscopy, thus significantly reducing analysis time and cost. In conclusion, the Eddy current method with calibration before each measurement strategy is proposed as an effective alternative for measuring anodized layer thickness in applications where speed and precision are critical.

Applied SciencesVol. 15(16)
Universidad Autónoma del Estado de Hidalgo (MX), Universidad Veracruzana (MX), Universidad Autónoma de Nuevo León (MX)
Universidad Autónoma de Nuevo León
Openalex Percentile: Top 34%
Anodic Oxide Films and Nanostructures
0.52
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