Non-Destructive Eddy Current Testing System Based on Discrete Wavelet Transform

As a form of non-destructive testing, eddy current testing is widely used for detecting surface micro-damage on metal components in sectors such as aerospace. Conventional frequency-domain analysis techniques often fail to effectively extract defect-related features from non-stationary eddy current signals. This paper proposes an ECT system based on the Discrete Wavelet Transform to address this limitation. In hardware design, the system employs a DDS to generate a 1 MHz excitation signal for the probe. High-precision acquisition of defect response signals is achieved using an IQ demodulator and a 24-bit ADC. For signal processing, the Haar wavelet is applied for single-level decomposition. This method successfully isolates the defect response signal within the high-frequency detail coefficients. Experimental results demonstrate that for a metal surface notch with a depth of 1 mm, the system significantly improves the SNR, resulting in a ΔSNR improvement of 3.64 dB, which is 0.36 dB higher than that achieved using time-domain processing.

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Publication Details

Journal
Electronics
Published
2025-08-15
DOI
https://doi.org/10.3390/electronics14163239
Citations
1
Primary Topic
Non-Destructive Testing Techniques
Type
article
Field-Weighted Citation Impact
0.71
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article

Non-Destructive Eddy Current Testing System Based on Discrete Wavelet Transform

Jia Jia, Zhengtao Xia
1 citations
Electronics
Non-Destructive Testing Techniques
0.71
article

Non-Destructive Eddy Current Testing System Based on Discrete Wavelet Transform

Jia Jia, Zhengtao Xia
article en
1 citations

Abstract

As a form of non-destructive testing, eddy current testing is widely used for detecting surface micro-damage on metal components in sectors such as aerospace. Conventional frequency-domain analysis techniques often fail to effectively extract defect-related features from non-stationary eddy current signals. This paper proposes an ECT system based on the Discrete Wavelet Transform to address this limitation. In hardware design, the system employs a DDS to generate a 1 MHz excitation signal for the probe. High-precision acquisition of defect response signals is achieved using an IQ demodulator and a 24-bit ADC. For signal processing, the Haar wavelet is applied for single-level decomposition. This method successfully isolates the defect response signal within the high-frequency detail coefficients. Experimental results demonstrate that for a metal surface notch with a depth of 1 mm, the system significantly improves the SNR, resulting in a ΔSNR improvement of 3.64 dB, which is 0.36 dB higher than that achieved using time-domain processing.

ElectronicsVol. 14(16)
Jiangsu University of Science and Technology (CN)
Openalex Percentile: Top 28%
Non-Destructive Testing Techniques
0.71
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