Design of Long-Wave Fully Polarized HgCdTe Photodetector Based on Silicon Metasurface

Polarization-sensitive photodetection is critical for advanced optical systems, yet achieving simultaneous high-fidelity recognition of the circularly polarized (CP) and linearly polarized (LP) light with compact designs remains challenging. Here, we use COMSOL 5.6 software to demonstrate a silicon metasurface-integrated MCT photodetector that resolves both CP and LP signals through a single ultrathin platform. The device deciphers LP states via four orientation-specific linear gratings for differential detection, while chiral symmetric silicon nanostructures enable direct CP discrimination with an exceptional extinction ratio of 30 dB. The proposed architecture combines two breakthroughs: (1) superior polarization reconstruction capability, achieved via the synergy of grating-induced polarization selectivity and chiral near-field enhancement, and (2) a fabrication-simplified process that eliminates multilayer stacking or complex alignment steps. This work establishes a new paradigm for miniaturized, high-performance polarization optics, with potential applications in polarization imaging, quantum communication, and hyperspectral sensing.