Analog testing with non-sinusoidal waveforms in the single mode: a new parametric fault detection approach

This paper presents the new parametric fault detection approach (PFDA) for analog circuits that uses non-sinusoidal waveforms in the single mode (NSWs_SM). The PFDA is achieved by stimulating the propagation delay in the time domain resulting from circuit component shifts at the test response of the analog circuit under test (ACUT). The stimulated temporal width at various levels of the test response is accurately measured. The robustness of time measurement used in the proposed design approach is achieved compared with the previously published work. The temporal width at each level resulting from component shifts is compared with the global boundaries derived from the worst-case analysis for each level using either the PSpice or MATLAB simulation. Finally, the PFDA is applied to the ACUTs selected from a range of analog benchmark circuits. The effectiveness of the PFDA compared to the analogous analog testing procedures employing NSWs_SM is demonstrated in different scenarios.