A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective
The Design, Automation, and Test in Europe (DATE) Conference is a premier international event providing unique networking opportunities, bringing together designers and design automation users, researchers and vendors, and specialists in hardware and software design, test, and manufacturing of electronic circuits and systems.
Authors
- Aida Todri‐Sanial (ORCID: https://orcid.org/0000-0001-8573-2910)
- Valeria Bertacco (ORCID: https://orcid.org/0000-0002-0319-3368)
- Theocharis Theocharides (ORCID: https://orcid.org/0000-0001-7222-9152)
- Alberto Bosio (ORCID: https://orcid.org/0000-0001-6116-7339)
Institutions
- École Centrale de Lyon (FR)
- University of Michigan (US)
- University of Cyprus (CY)
- Eindhoven University of Technology (NL)
Publication Details
- Journal
- IEEE Design and Test
- Published
- 2025-08-20
- DOI
- https://doi.org/10.1109/mdat.2025.3576974
- Primary Topic
- Experimental Learning in Engineering
- Type
- article
- Field-Weighted Citation Impact
- 0.00