Optimized Adaptive Multi-Scale Architecture for Surface Defect Recognition
Detection of defects on steel surface is crucial for industrial quality control. To address the issues of structural complexity, high parameter volume, and poor real-time performance in current detection models, this study proposes a lightweight model based on an improved YOLOv11. The model first reconstructs the backbone network by introducing a Reversible Connected Multi-Column Network (RevCol) to effectively preserve multi-level feature information. Second, the lightweight FasterNet is embedded into the C3k2 module, utilizing Partial Convolution (PConv) to reduce computational overhead. Additionally, a Group Convolution-driven EfficientDetect head is designed to maintain high-performance feature extraction while minimizing consumption of computational resources. Finally, a novel WISEPIoU loss function is developed by integrating WISE-IoU and POWERFUL-IoU to accelerate the model convergence and optimize the accuracy of bounding box regression. The experiments on the NEU-DET dataset demonstrate that the improved model achieves a parameter reduction of 39.1% from the baseline and computational complexity of 49.2% reduction in comparison with the baseline, with an [email protected] of 0.758 and real-time performance of 91 FPS. On the DeepPCB dataset, the model exhibits reduction of parameters and computations by 39.1% and 49.2%, respectively, with [email protected] = 0.985 and real-time performance of 64 FPS. The study validates that the proposed lightweight framework effectively balances accuracy and efficiency, and proves to be a practical solution for real-time defect detection in resource-constrained environments.
Authors
- Lingyu Yan (ORCID: https://orcid.org/0000-0003-2468-3881)
- Bogdan Adamyk (ORCID: https://orcid.org/0000-0001-5136-3854)
- Heping Zhang (ORCID: https://orcid.org/0000-0003-3608-2549)
- Yue Wang (ORCID: https://orcid.org/0000-0001-5984-4679)
- Xueli Chang (ORCID: https://orcid.org/0000-0001-5145-2283)
Institutions
- Aston University (GB)
- Hubei University of Technology (CN)
Publication Details
- Journal
- Algorithms
- Published
- 2025-08-20
- DOI
- https://doi.org/10.3390/a18080529
- Citations
- 1
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 1.24
Funders
- National Natural Science Foundation of China