IN-SITU TGA-IR Material Characterization System Based on a Resonant Cantilever and its Application in Regulating the Properties of Single Crystal COF

For the first time, a novel in-situ TGA-IR system combining a resonant microcantilever thermogravimetric analyzer (TGA) with a Fourier transform infrared spectrometer (FT-IR) is reported to analyze and optimize the properties of covalent organic framework (COF) single crystals. The proposed system integrates the ultra-sensitive mass measurement and on-chip heating capabilities of the cantilever with the molecular structure analysis provided by FT-IR, enabling dual-functional in-situ characterization. The method optimizes the heat treatment process of COF single crystals and effectively removes chemical residues. Notably, the amount of NO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> adsorption in the heat-treated COF crystal LZU-111 increased, demonstrating the effectiveness and broad potential of this system for materials characterization.