Enhanced Wafer-Level Propagation Loss Measurement in Silicon Photonic Circuits Using Mach-Zehnder Interferometer with Thermo-Optic Phase Shifter
This study presents a Mach-Zehnder interferometer method incorporating a thermo-optic phase shifter to measure silicon-waveguide propagation loss, minimizing wavelength fluctuations for stable sub-1 dB measurements and achieving greater precision than the conventional cutback method.
Authors
- Hiroshi Fukuda (ORCID: https://orcid.org/0000-0001-8112-7043)
- Kodai Sato (ORCID: https://orcid.org/0009-0003-7573-9547)
Institutions
- Chitose Institute of Science and Technology (JP)
Publication Details
- Published
- 2025-06-29
- DOI
- https://doi.org/10.23919/oecc/psc62146.2025.11110021
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00