Application of Moving Window Mesh Technology to Simulate Electron Gun with EOS
EOS, widely used in China traveling wave tube design, employs finite element analysis to simulate physical systems by simplifying them into interconnected elements. Global mesh refinement enhances accuracy but compromises computer performance and efficiency in electron gun simulations. This paper proposes a moving window dynamic local mesh refinement technique for simulating a electron gun, which refines the mesh along the electron path to optimize efficiency and ensure accuracy.
Authors
- Xiaobing Wang (ORCID: https://orcid.org/0009-0008-3887-4789)
- Yulu Hu (ORCID: https://orcid.org/0000-0002-9800-3300)
- Bin Li (ORCID: https://orcid.org/0000-0002-9093-3239)
- Yang Li (ORCID: https://orcid.org/0000-0002-2479-2538)
- Quan Hu (ORCID: https://orcid.org/0000-0002-0295-3820)
- Xiaofang Zhu
Institutions
- University of Electronic Science and Technology of China (CN)
Publication Details
- Published
- 2025-04-14
- DOI
- https://doi.org/10.1109/ivec63678.2025.11115641
- Primary Topic
- Engineering Applied Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China