Side-Channel Noise Intrusion (SNI): A New Phenomenon and Challenge for Cybersecurity of Power Electronics

Recently, the Laboratory for Energy and Switching-Electronic Systems (LESES) at the University of Illinois Chicago (UIC) has demonstrated a new approach to compromise the performance and stability of power-electronic systems (PES) such as inverters, solid-state transformers (SSTs) using side-channel noise intrusion (SNI). In this manuscript, we outline what the reported SNI phenomenon is, how it is realized, and how it distinguishes from other apparently related cybersecurity threats. Finally, we also illustrate the effects of SNI on the performance of an inverter and an ac/ac SST and how cyber-resilience can be achieved against such intentional intrusions.