Study of Dielectric Strength of Ceramic Substrates for Power Electronics
This paper is focused on a detailed study of dielectric strength and surface and inner morphology of ceramic substrates for power electronics applications. Dielectric strength is a key parameter in this field. It depends on the type of ceramic material and substrate thickness. The presented study includes five types of ceramic substrate material and five different thicknesses of substrate. The results of dielectric strength measurement depend on ceramic material and substrate thickness and related to morphology are described in this paper.
Authors
- Jan Řeboun (ORCID: https://orcid.org/0000-0002-8680-2199)
- Pavel Prosr (ORCID: https://orcid.org/0000-0002-7484-2492)
- Josef Pihera (ORCID: https://orcid.org/0000-0002-0521-6869)
- Jiří Hlína (ORCID: https://orcid.org/0000-0002-0900-7300)
- Petr Kvasnička
- Tomas Kupilik
Institutions
- University of West Bohemia in Pilsen (CZ)
Publication Details
- Published
- 2025-05-14
- DOI
- https://doi.org/10.1109/isse65583.2025.11120980
- Primary Topic
- Material Properties and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Ministry of Education