Enhanced electrical properties of flexible AlGaN/GaN HEMT arrays via stress engineering
Wide-bandgap semiconductors, by virtue of their superior electrical and mechanical properties, enable significant performance enhancements in flexible electronics. Here, we report flexible AlGaN/GaN high-electron-mobility transistor (HEMT) arrays fabricated through deep silicon etching and wafer-scale substrate transfer processes. The flexible AlGaN/GaN HEMT devices demonstrate a maximum saturated drain current density of 166.5 mA/mm at VGS = 1 V and a peak transconductance of 42.6 mS/mm at VDS = 5 V, along with notable tolerance to mechanical deformation. Moreover, under in-plane tensile strain, the devices exhibit improved electrical performance. This enhancement is attributed to the modulation of the two-dimensional electron gas density at the AlGaN/GaN heterointerface driven by strain-induced piezoelectric polarization. These favorable characteristics underscore the strong potential of HEMTs for next-generation flexible electronic applications, particularly in fields such as biosensing, smart wearable technology, human–machine interactions, and intelligent microsystems.
Authors
- Tao Tang (ORCID: https://orcid.org/0000-0003-4474-1604)
- Xiu Zhang (ORCID: https://orcid.org/0000-0002-7451-8035)
- Wei Ling (ORCID: https://orcid.org/0000-0002-2544-5650)
- Junchen Liu (ORCID: https://orcid.org/0000-0002-2475-8495)
- Hu Tao
Institutions
- Center for Excellence in Brain Science and Intelligence Technology (CN)
- Zhejiang Lab (CN)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2025-08-18
- DOI
- https://doi.org/10.1063/5.0268995
- Citations
- 1
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 1.26
Funders
- National Natural Science Foundation of China