Ultra-thin f-theta metalens with high focus resolution and large field of view

Conventional f-theta(<i>f-θ</i>) lens systems often rely on cascading multiple lenses or adopting complex surface profiles to achieve high-precision scanning and laser processing over a large field of view (FOV), leading to significant increases in system volume and manufacturing complexity. This study presents an ultra-thin <i>f-θ</i> lens for a 10.6µm laser processing system, realizing high-performance scanning through a collaborative optimization method of cascaded metasurfaces. Simulation results based on dual-layer cascaded metasurfaces show that within the ±32° light deflection range, the spot diameter remains below 20µm, the maximum <i>f-θ</i> distortion is controlled at 0.19%, and the Strehl ratio (SR) across the entire FOV exceeds 0.99, verifying the system's imaging performance approaching the diffraction limit. Phase sampling analysis of the cascaded metalenses indicates that when the sampling step varies within 3-9µm, there is no significant difference in spot performance, which greatly reduces the fabrication difficulty and cost. Further research demonstrates that when the phase mutation rate is controlled within 8%, the system maintains stable scanning characteristics, while exceeding 9% leads to severe wavefront distortion and drastic deterioration of optical performance, providing a quantitative basis for processing error control. The wavelength analysis of the designed <i>f-θ</i> lens reveals that it maintains good performance within an 80 nm bandwidth. This study provides an integrated solution for compact laser processing systems, and its technical achievements can promote the large-scale application of metasurface optical elements in optical imaging, optical metrology, and laser processing.

Authors

Institutions

Publication Details

Journal
Optics Express
Published
2025-08-19
DOI
https://doi.org/10.1364/oe.570030
Citations
1
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.73
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Ultra-thin f-theta metalens with high focus resolution and large field of view

Xingang Ren, Li Ding, Yunzhe Zhang, Yingbin Xing et al.
1 citations
Optics Express
Semiconductor materials and devices
0.73
article

Ultra-thin f-theta metalens with high focus resolution and large field of view

Xingang Ren, Li Ding, Yunzhe Zhang, Yingbin Xing, Zhi Xiang Huang, Xiaobo Zhang, Gang Wang, Hao Ding, Ting Jiang, Mansong Rong
article en
1 citations

Abstract

Conventional f-theta(<i>f-θ</i>) lens systems often rely on cascading multiple lenses or adopting complex surface profiles to achieve high-precision scanning and laser processing over a large field of view (FOV), leading to significant increases in system volume and manufacturing complexity. This study presents an ultra-thin <i>f-θ</i> lens for a 10.6µm laser processing system, realizing high-performance scanning through a collaborative optimization method of cascaded metasurfaces. Simulation results based on dual-layer cascaded metasurfaces show that within the ±32° light deflection range, the spot diameter remains below 20µm, the maximum <i>f-θ</i> distortion is controlled at 0.19%, and the Strehl ratio (SR) across the entire FOV exceeds 0.99, verifying the system's imaging performance approaching the diffraction limit. Phase sampling analysis of the cascaded metalenses indicates that when the sampling step varies within 3-9µm, there is no significant difference in spot performance, which greatly reduces the fabrication difficulty and cost. Further research demonstrates that when the phase mutation rate is controlled within 8%, the system maintains stable scanning characteristics, while exceeding 9% leads to severe wavefront distortion and drastic deterioration of optical performance, providing a quantitative basis for processing error control. The wavelength analysis of the designed <i>f-θ</i> lens reveals that it maintains good performance within an 80 nm bandwidth. This study provides an integrated solution for compact laser processing systems, and its technical achievements can promote the large-scale application of metasurface optical elements in optical imaging, optical metrology, and laser processing.

Optics ExpressVol. 33(18)
Fujikura (United States) (US)
Openalex Percentile: Top 25%
Semiconductor materials and devices
0.73
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.