An algorithm for fast uncertainty evaluation in RMS voltage measurement

This paper presents a new algorithm for fast uncertainty evaluation of root mean square (RMS) voltage measurement. It enables the evaluation of the expanded measurement uncertainty and partial uncertainties, which are useful in metrological analysis of the measurement. It can be used for any measurement system in which the RMS value is determined based on voltage samples. Various sources of uncertainty have been considered for this measurement system. The proposed algorithm is easier to implement than the commonly used uncertainty propagation method. Its operating principle is based on the Monte Carlo method. However, it allows the computation of the RMS measurement uncertainty within a significantly shorter time compared to the classical Monte Carlo method. The simulation and experimental results presented in this paper confirm the correct operation of the new algorithm and the acceleration of uncertainty computations up to 200 times in RMS measurement based on 1000 voltage samples.