F2T2-HIT: A U-Shaped FFT Transformer and Hierarchical Transformer for Reflection Removal

Single Image Reflection Removal (SIRR) technique plays a crucial role in image processing by eliminating unwanted reflections from the background. These reflections, often caused by photographs taken through glass surfaces, can significantly degrade image quality. SIRR remains a challenging problem due to the complex and varied reflections encountered in real-world scenarios. These reflections vary significantly in intensity, shapes, light sources, sizes, and coverage areas across the image, posing challenges for most existing methods to effectively handle all cases. To address these challenges, this paper introduces a U-shaped Fast Fourier Transform Transformer and Hierarchical Transformer (F2T2-HiT) architecture, an innovative Transformer-based design for SIRR. Our approach uniquely combines Fast Fourier Transform (FFT) Transformer blocks and Hierarchical Transformer blocks within a UNet framework. The FFT Transformer blocks leverage the global frequency domain information to effectively capture and separate reflection patterns, while the Hierarchical Transformer blocks utilize multi-scale feature extraction to handle reflections of varying sizes and complexities. Extensive experiments conducted on three publicly available testing datasets demonstrate state-of-the-art performance, validating the effectiveness of our approach.

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Publication Details

Published
2025-08-18
DOI
https://doi.org/10.1109/icip55913.2025.11084474
Citations
4
Primary Topic
High voltage insulation and dielectric phenomena
Type
article
Field-Weighted Citation Impact
2.07
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article

F2T2-HIT: A U-Shaped FFT Transformer and Hierarchical Transformer for Reflection Removal

Jiaming Ding, Zibo Meng, Kangning Yang, Lan Fu et al.
4 citations
High voltage insulation and dielectric phenomena
2.07
article

F2T2-HIT: A U-Shaped FFT Transformer and Hierarchical Transformer for Reflection Removal

Jiaming Ding, Zibo Meng, Kangning Yang, Lan Fu, Jie Cai, Huiming Sun, Liang-Wei Ouyang, Chiu Man Ho
article en
4 citations

Abstract

Single Image Reflection Removal (SIRR) technique plays a crucial role in image processing by eliminating unwanted reflections from the background. These reflections, often caused by photographs taken through glass surfaces, can significantly degrade image quality. SIRR remains a challenging problem due to the complex and varied reflections encountered in real-world scenarios. These reflections vary significantly in intensity, shapes, light sources, sizes, and coverage areas across the image, posing challenges for most existing methods to effectively handle all cases. To address these challenges, this paper introduces a U-shaped Fast Fourier Transform Transformer and Hierarchical Transformer (F2T2-HiT) architecture, an innovative Transformer-based design for SIRR. Our approach uniquely combines Fast Fourier Transform (FFT) Transformer blocks and Hierarchical Transformer blocks within a UNet framework. The FFT Transformer blocks leverage the global frequency domain information to effectively capture and separate reflection patterns, while the Hierarchical Transformer blocks utilize multi-scale feature extraction to handle reflections of varying sizes and complexities. Extensive experiments conducted on three publicly available testing datasets demonstrate state-of-the-art performance, validating the effectiveness of our approach.

Openalex Percentile: Top 12%
High voltage insulation and dielectric phenomena
2.07
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F2T2-HIT: A U-Shaped FFT Transformer and Hierarchical Transformer for Reflection Removal — Jiaming Ding, Zibo Meng, et al. · (2025) | TGRS Research Map | TGRS