Research on the Measurement of the Thickness of Transparent Thermal Insulation Materials Based on the Michelson Interferometer
Abstract Focuses on the critical issue of thickness measurement of transparent insulating materials in the energy field, detailing experimental research utilizing the Michelson interferometer. By thoroughly analyzing the principles, experimental procedures, and results of this method for measuring the thickness of transparent insulating materials, and comparing it with traditional measurement techniques, its accuracy and reliability are validated. This study provides essential measurement technical support for material research and energy-saving applications in related energy fields, contributing to the advancement of energy efficiency and the development of energy-saving technologies.
Authors
- Y. H. Chang (ORCID: https://orcid.org/0000-0003-2702-6094)
- Guanglin Niu
- Jiawei Lai (ORCID: https://orcid.org/0000-0002-1351-4268)
- Yukun Wang (ORCID: https://orcid.org/0000-0002-6358-8142)
- Mengxing Lv
- Guoxing Yang (ORCID: https://orcid.org/0000-0002-1019-2021)
- Ruoyu Yang (ORCID: https://orcid.org/0000-0002-9147-5030)
Institutions
- Shenzhen Institute of Information Technology (CN)
- Guangdong University of Petrochemical Technology (CN)
Publication Details
- Journal
- Journal of Physics Conference Series
- Published
- 2025-08-01
- DOI
- https://doi.org/10.1088/1742-6596/3074/1/012002
- Primary Topic
- Thermal Analysis in Power Transmission
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Guangdong University of Petrochemical Technology
- Science and Technology Planning Project of Guangdong Province