Generator Set Uji Untuk Diagnosis Kesalahan pada Rangkaian Digital Kombinasional Demultiplexer 1 line to 4 line Menggunakan Metode Tabel Kesalahan

A small error in the IC can become a big problem if it is not detected and used by the user. Therefore, a fault diagnosis method is needed to ensure the IC functions properly. The method used must be fast and efficient in checking the IC. One method that can be used is designing a test set generator based on the diagnostic tree principle with the error table method. The implementation of the 74ACT139 dual 1 line to 4 line demultiplexer system in this research shows that this method is effective for fault diagnosis. As a result, all stuck logic damage can be detected with an average efficiency of 93.01%. The longest test of 16 times shows an efficiency of 87.5% at f0 and f15, while the shortest test of 1 time shows an efficiency of 99.21% at f1.