Special Issue: Electron Diffraction and Structural Imaging—Volume II
Following the success of the first edition of our Special Issue “Electron Diffraction and Structural Imaging”, we present Volume II, featuring new and innovative contributions that further expand the scope and depth of this rapidly evolving field [...]
Authors
- Partha Pratim Das (ORCID: https://orcid.org/0000-0002-6110-6322)
- Enrico Mugnaioli (ORCID: https://orcid.org/0000-0001-9543-9064)
- Arturo Ponce (ORCID: https://orcid.org/0000-0001-5529-6468)
- Stavros Nicolopoulos (ORCID: https://orcid.org/0000-0002-6258-094X)
Institutions
- University of Pisa (IT)
- The University of Texas at San Antonio (US)
Publication Details
- Journal
- Symmetry
- Published
- 2025-08-11
- DOI
- https://doi.org/10.3390/sym17081287
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00