Performance Evaluation and Thermal Stability Assessment of Graphene Nanoribbon Doped Dielectrically Modulated Tunnel Field Effect Transistor
The performance of Dual Material Heterodielectric Graphene Nanoribbon channel tunnel FET (DM-H-GNR-TFET) and TFETs based on Silicon (DM-H-Si-TFET and DM-Si-TFET) are compared in this work. The narrow bandgap, higher carrier mobility, and fast saturation velocity of the two-dimensional material GNR have led to its proposal as a channel material to improve device performance. This analysis of the proposed structure’s DC, RF, performance and thermal stability has been conducted. The GNR-based channel TFET demonstrates a higher current ratio of the order of 1014, in contrast to the Si-based TFET (~1011) with improved subthreshold swing. This investigation encompasses the influence of temperature on the DC parameters, in addition to the analog/RF figures of merit for the proposed structure. Moreover, the results are compared with existing literature on TFETs, revealing that DM-H-GNR-TFET excels Si-based TFETs and other variants.
Authors
- Shrish Bajpai (ORCID: https://orcid.org/0000-0001-5598-1940)
- Syed Hasan Saeed (ORCID: https://orcid.org/0000-0002-8194-5203)
- Vedvrat (ORCID: https://orcid.org/0009-0002-9023-1699)
- Sushroot
Institutions
- Integral University (IN)
- Indian Institute of Technology Kanpur (IN)
Publication Details
- Journal
- Physics of the Solid State
- Published
- 2025-08-01
- DOI
- https://doi.org/10.1134/s106378342560027x
- Citations
- 3
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 2.19