The Segregated and Hybrid TBPSA algorithm with applications in SRF test pattern scheduling

In semiconductor manufacturing, the scan routing fabric (SRF) technology enables efficient hardware testing by concurrently running multiple test patterns. However, its total test time depends on the scheduling algorithm used. Current approaches rely on greedy algorithms which provide good but sub-optimal results. In this paper, we define the SRF test scheduling as an optimization problem, discuss its challenges, and propose a solution based on a combination of existing optimization algorithms.