Scratch-induced damage of doped DLC and MoS <sub>2</sub> coatings—Deep symbolic analysis
Understanding contact-induced damage is of paramount importance in the analysis of the lifespan and performance of surface coatings. In this work, we investigate the effects of dopants and interlayers on the structural durability of diamond-like carbon coatings (DLCs) and molybdenum disulfide (MoS<sub>2</sub>) coatings on stainless steel via micro-scratch tests. The analysis of XPS survey spectra and Raman spectra of DLCs shows that the ratio of sp<sup>2</sup>/sp<sup>3</sup> (i.e., the intensity ratio of sp<sup>2</sup> over sp<sup>3</sup> obtained by XPS) is proportional to <em>I</em><sub>D</sub>/<em>I</em><sub>G</sub>, where <em>I</em><sub>D</sub> and <em>I</em><sub>G</sub> are the intensities of D and G bands of the Raman spectra. The analysis of the scratch tests reveals that there are three critical loads for the scratch-induced damage of the DLCs and MoS<sub>2</sub> coatings, corresponding, respectively, to the initiation of periodic V-cracking, the minimum load for periodic semicircle cracking or peel-off, and the minimum load for partial and periodic delamination. Dopants can reduce the friction coefficient of the DLCs and have negligible effect on the Ti/MoS<sub>2</sub> coatings. The Cr interlayer can better enhance the bonding strength between the DLCs and the steel substrate than the Si interlayer. Doping Cr and H can reduce the<em> </em>hardness of DLCs; doping Si can increase the hardness of the<em> </em>DLCs; and doping Ti, Pb, and PbTi can reduce the hardness of the MoS<sub>2</sub> coatings. Deep Symbolic Optimization (DSO) algorithm is used to establish nominal-mathematical formulations between the critical variables for the scratch test and the materials parameters of the surface coating. The DSO analysis demonstrates the feasibility of using “deep-learning” to establish “quantitative” relationships between the critical variables for mechanical deformation and materials parameters.
Authors
- Ming Liu (ORCID: https://orcid.org/0000-0001-6794-5023)
- Tang Gu (ORCID: https://orcid.org/0000-0001-7265-3295)
- Rui Liang (ORCID: https://orcid.org/0000-0002-5095-9637)
- Guangan Zhang (ORCID: https://orcid.org/0000-0001-6046-6601)
- Zhitong Xu (ORCID: https://orcid.org/0000-0001-9138-4123)
- Jinyang Jiang (ORCID: https://orcid.org/0000-0002-0134-9373)
- Fuqian Yang
- Noraphat Yuktanan
Publication Details
- Journal
- Friction
- Published
- 2025-08-12
- DOI
- https://doi.org/10.26599/frict.2025.9441166
- Citations
- 1
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.73
Funders
- National Natural Science Foundation of China