Up to 3.7 A Operation of E-mode MOSFET based on Heteroepitaxial ε-Ga<sub>2</sub>O<sub>3</sub>

Ultra-wide bandgap Gallium oxide (Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>) has emerged as a promising candidate for next-generation high-power electronic devices due to its exceptional material properties [1]. Among its polymorphs, $\varepsilon$ Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>, the second most stable phase, exhibits unique advantages such as high-quality heteroepitaxial growth and strong polarization effects, making it particularly attractive for advanced device applications [2]. In prior work, we demonstrated the successful fabrication of heteroepitaxial $\varepsilon$ - Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> MOSFETs on sapphire substrates using metal-organic chemical vapor deposition (MOCVD) combined with a fluorine plasma surface doping technique [3]. While recent research has predominantly focused on achieving high power figures of merit (PFOM) and exploring novel device architectures, the realization of large-area devices capable of sustaining high output currents remains critical for practical applications [4]. However, the development of large-area Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> transistors is hindered by challenges such as non-uniform material growth and process variability. In this study, we present an enhancement-mode (E-mode) $\varepsilon-\mathrm{Ga}_{2} \mathrm{O}_{3}$ MOSFET achieving a record output current of 3.7 A, underscoring its potential for high-power applications.

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Published
2025-06-22
DOI
https://doi.org/10.1109/drc66027.2025.11105712
Primary Topic
Ga2O3 and related materials
Type
article
Field-Weighted Citation Impact
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article

Up to 3.7 A Operation of E-mode MOSFET based on Heteroepitaxial ε-Ga2O3

Xin Luo, Linxuan Li, Xing Lü, Yanli Pei et al.
Ga2O3 and related materials
article

Up to 3.7 A Operation of E-mode MOSFET based on Heteroepitaxial ε-Ga2O3

Xin Luo, Linxuan Li, Xing Lü, Yanli Pei, Gang Wang, Shengheng Zhu, Yuru Lai, Zimin Chen
article en

Abstract

Ultra-wide bandgap Gallium oxide (Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>) has emerged as a promising candidate for next-generation high-power electronic devices due to its exceptional material properties [1]. Among its polymorphs, $\varepsilon$ Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>, the second most stable phase, exhibits unique advantages such as high-quality heteroepitaxial growth and strong polarization effects, making it particularly attractive for advanced device applications [2]. In prior work, we demonstrated the successful fabrication of heteroepitaxial $\varepsilon$ - Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> MOSFETs on sapphire substrates using metal-organic chemical vapor deposition (MOCVD) combined with a fluorine plasma surface doping technique [3]. While recent research has predominantly focused on achieving high power figures of merit (PFOM) and exploring novel device architectures, the realization of large-area devices capable of sustaining high output currents remains critical for practical applications [4]. However, the development of large-area Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> transistors is hindered by challenges such as non-uniform material growth and process variability. In this study, we present an enhancement-mode (E-mode) $\varepsilon-\mathrm{Ga}_{2} \mathrm{O}_{3}$ MOSFET achieving a record output current of 3.7 A, underscoring its potential for high-power applications.

Sun Yat-sen University (CN)
National Natural Science Foundation of China, Research and Development
Openalex Percentile: Top 87%
Ga2O3 and related materials
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