Up to 3.7 A Operation of E-mode MOSFET based on Heteroepitaxial ε-Ga<sub>2</sub>O<sub>3</sub>
Ultra-wide bandgap Gallium oxide (Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>) has emerged as a promising candidate for next-generation high-power electronic devices due to its exceptional material properties [1]. Among its polymorphs, $\varepsilon$ Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>, the second most stable phase, exhibits unique advantages such as high-quality heteroepitaxial growth and strong polarization effects, making it particularly attractive for advanced device applications [2]. In prior work, we demonstrated the successful fabrication of heteroepitaxial $\varepsilon$ - Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> MOSFETs on sapphire substrates using metal-organic chemical vapor deposition (MOCVD) combined with a fluorine plasma surface doping technique [3]. While recent research has predominantly focused on achieving high power figures of merit (PFOM) and exploring novel device architectures, the realization of large-area devices capable of sustaining high output currents remains critical for practical applications [4]. However, the development of large-area Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> transistors is hindered by challenges such as non-uniform material growth and process variability. In this study, we present an enhancement-mode (E-mode) $\varepsilon-\mathrm{Ga}_{2} \mathrm{O}_{3}$ MOSFET achieving a record output current of 3.7 A, underscoring its potential for high-power applications.
Authors
- Xin Luo (ORCID: https://orcid.org/0000-0002-7997-3934)
- Linxuan Li (ORCID: https://orcid.org/0000-0002-7920-4684)
- Xing Lü (ORCID: https://orcid.org/0000-0001-5808-9552)
- Yanli Pei (ORCID: https://orcid.org/0000-0003-3456-0746)
- Gang Wang (ORCID: https://orcid.org/0000-0001-9110-3942)
- Shengheng Zhu
- Yuru Lai (ORCID: https://orcid.org/0009-0000-6058-1378)
- Zimin Chen (ORCID: https://orcid.org/0000-0002-2051-7678)
Institutions
- Sun Yat-sen University (CN)
Publication Details
- Published
- 2025-06-22
- DOI
- https://doi.org/10.1109/drc66027.2025.11105712
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Research and Development