A Novel De-Mirroring Approach for Capacitance and Resistance Extraction in Complementary FET: A Quasi-Static Small Signal Model

A quasi-static small signal model is vitally important to bridge the gap in device circuit co-design. To the best of our knowledge, for the first time in this paper, we proposed the small-signal model of a Complementary FET (CFET) with the accurate extraction of capacitance and resistances using de-mirroring approach. Unlike conventional approach, de-mirroring considers the drain voltage ($\mathrm{V}_{\mathrm{DS}}$) dependent capacitances separately. The extracted overall gate capacitance ($\mathrm{C}_{\mathrm{gg}}$) is $10.03 \%$ lower than the mirroring approach. The various components of resistances and capacitances are modeled using the transmission line method (TLM) and conformal mapping (CM), where the model data shows the error of less than $4 \%$ with the simulation data.

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Published
2025-06-22
DOI
https://doi.org/10.1109/drc66027.2025.11105724
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
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article

A Novel De-Mirroring Approach for Capacitance and Resistance Extraction in Complementary FET: A Quasi-Static Small Signal Model

Sandeep Kumar, Navjeet Bagga, Sudeb Dasgupta, D Patil et al.
Advancements in Semiconductor Devices and Circuit Design
article

A Novel De-Mirroring Approach for Capacitance and Resistance Extraction in Complementary FET: A Quasi-Static Small Signal Model

Sandeep Kumar, Navjeet Bagga, Sudeb Dasgupta, D Patil, Khushi Jain
article en

Abstract

A quasi-static small signal model is vitally important to bridge the gap in device circuit co-design. To the best of our knowledge, for the first time in this paper, we proposed the small-signal model of a Complementary FET (CFET) with the accurate extraction of capacitance and resistances using de-mirroring approach. Unlike conventional approach, de-mirroring considers the drain voltage ($\mathrm{V}_{\mathrm{DS}}$) dependent capacitances separately. The extracted overall gate capacitance ($\mathrm{C}_{\mathrm{gg}}$) is $10.03 \%$ lower than the mirroring approach. The various components of resistances and capacitances are modeled using the transmission line method (TLM) and conformal mapping (CM), where the model data shows the error of less than $4 \%$ with the simulation data.

Indian Institute of Technology Roorkee (IN), Indian Institute of Technology Bhubaneswar (IN)
Openalex Percentile: Top 81%
Advancements in Semiconductor Devices and Circuit Design
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