Spectroscopic, AC conductivity and dielectric properties of Nd2O3 doped lithium silicophosphate glass

Basic lithium silicophosphate glasses of composition (P2O5 50%- SiO2 30%- Li2O 20%) and those doped with up to 6.0 wt % Nd2O3 are prepared, and we have been studying the FTIR spectral to illustrate the structural properties. The features of IR bands according to the mixture of silicate and phosphate groups for studied glass were obtained by the IR absorption spectra. Both XRD and TEM/SAED confirmed the homogeneous dispersion of Nd3⁺ ions and absence of phase separation, corroborating the structural integrity of the glass network. The large amount of phosphate oxide in the studied samples makes the attendance of the phosphate group slightly high and this was revealed using the deconvolution method of the IR spectra. Also, AC conductivity, $${\sigma }_{ac}$$ , and dielectric behavior in the range of frequency 0.5 × 103 − 3243 × 103 Hz over a temperature range of 302–483K has been studied. In both glasses temperature dependence of $${\sigma }_{ac}$$ increased nonlinearly with various frequencies. Frequency dependence of $${\sigma }_{ac}$$ has been determined using the Jonscher power law. The principal conduction mechanism in basic and doped lithium silicophosphate glasses was found to be correlated to barrier hopping. In addition, dielectric constant, loss tangent, capacitance, and dielectric loss were derived from various ranges of frequency and temperature for basic and 6wt% doped lithium silicophosphate glasses.