Fabrication of high-brightness silicon vacancy color-center ensembles in 4H-SiC via MeV particles
The silicon vacancy (VSi−) color centers in 4H-SiC are promising solid-state spin defects for quantum sensing applications, featuring long room-temperature coherence times, near-infrared photoluminescence, and an optically controllable spin–photon interface. However, it is essential to achieve high-brightness silicon vacancy color-center ensembles by different irradiations for efficient signal detection and high-fidelity quantum sensing. In this work, we conducted irradiation experiments of MeV electrons, protons, and laser-driven ions to investigate the influence of irradiation parameters on the fabrication of VSi− center ensembles, confirming the vital roles of crystal damage densities in the production yield of VSi− centers. Furthermore, the hot irradiation experiments reveal that irradiation at optimized temperatures can enhance the production yield of VSi− centers and break the inherent limitation of radiation-induced crystal damage, achieving higher-brightness ensembles. 1 MeV proton irradiation with 1013 cm−2 at 200 °C could achieve a 2–3 times stronger photoluminescence intensity enhancement than that at room-temperature irradiation. We established a controllable fabrication methodology for engineering the brightness of color-center ensembles through precise tuning of irradiation conditions, which paves the foundation for fabricating high-quality VSi− color-center ensembles and other color-center systems in wide-bandgap semiconductor materials.
Authors
- Jianming Xue (ORCID: https://orcid.org/0000-0002-0213-9239)
- Hongrui Guo
- Yuan Gao (ORCID: https://orcid.org/0000-0002-0278-7957)
- Jianhan Sun (ORCID: https://orcid.org/0009-0003-3567-9498)
- Yunbiao Zhao (ORCID: https://orcid.org/0000-0003-1701-7450)
- Wenjun Ma (ORCID: https://orcid.org/0000-0001-8217-8301)
- Senlin Huang (ORCID: https://orcid.org/0000-0003-0222-2478)
- Huaqing Huang (ORCID: https://orcid.org/0000-0002-7048-4640)
- Lin Lin (ORCID: https://orcid.org/0000-0001-8429-949X)
- Shang Tian (ORCID: https://orcid.org/0000-0001-9800-4197)
- Yulan Liang (ORCID: https://orcid.org/0000-0001-6792-488X)
- Yewei Song
Institutions
- Peking University (CN)
- State Key Laboratory of Nuclear Physics and Technology
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2025-08-11
- DOI
- https://doi.org/10.1063/5.0288542
- Citations
- 1
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73
Funders
- National Natural Science Foundation of China