Engineering phase transition and ferroelectric properties in acceptor-doped HfO2/SrRuO3 thin-film heterostructures by a charge-balance synergistic strategy
In HfO 2 , the stabilization of orthorhombic phase is crucial for hafnia-based ferroelectric devices. Here, we propose a charge-balance synergistic strategy to modulate phase transition and optimize ferroelectric properties in acceptor-doped HfO 2 thin-film heterostructures. Sm-doped HfO 2 /SrRuO 3 heterostructures are adopted as the platform, in which the acceptor Sm Hf ′ introduces extra holes into the HfO 2 controlled by doping concentration, while the SrRuO 3 electrode injects electrons depended on termination-controlled surface work function. Transition from monoclinic to orthorhombic and then to tetragonal phase is observed with increasing Sm concentration. The Sm-doping region for improved ferroelectricity is found to be depended on SrRuO 3 termination. These behaviors are ascribed to the charge-balance effect that combines the acceptor doping and the interface injection in the heterostructures. The holes in HfO 2 lattices are thus modulated to dominantly distribute on specific oxygen sublattices, lowering the relative energy between monoclinic and orthorhombic phases. We also extend the study into other acceptor-doped HfO 2 , such as La 3+ and Eu 3+ , and observe almost identical phase transition and ferroelectric behaviors. Our findings provide more physical insights into the stabilization of orthorhombic phase and open a new gateway for designing high-performance ferroelectric HfO 2 devices by harnessing both the electrode structures and the HfO 2 -based layers in heterostructure systems. • Charge-balance synergistic strategy modulates phase transition and optimizes ferroelectricity in doped HfO 2 films. • Electron injection and hole doping together yield high ratio of orthorhombic phase. • Ln-doped HfO 2 films show universal phase transition and improved ferroelectric properties.
Authors
- Kepeng Song (ORCID: https://orcid.org/0000-0003-3860-5761)
- Zheng Wen (ORCID: https://orcid.org/0000-0001-5026-6585)
- Tengfei Cao (ORCID: https://orcid.org/0000-0001-9508-2966)
- Weijie Zheng (ORCID: https://orcid.org/0000-0002-8483-0161)
- Chunyan Zheng
- Yuhao Yue
- Xiaoli Fan
- Xixiang Jing
- J.J. Li (ORCID: https://orcid.org/0009-0006-0776-0485)
Institutions
- Qingdao University (CN)
- Qingdao Agricultural University (CN)
- Shandong University (CN)
- Northwestern Polytechnical University (CN)
Publication Details
- Journal
- Journal of Materiomics
- Published
- 2025-08-12
- DOI
- https://doi.org/10.1016/j.jmat.2025.101122
- Citations
- 2
- Primary Topic
- Ferroelectric and Negative Capacitance Devices
- Type
- article
- Field-Weighted Citation Impact
- 1.46