Comparative Studies on Structural, Mechanical, Optical and Laser Damage Threshold Studies on Ammonium Acid Phthalate Crystal Grown by Conventional and SR Grown Crystals

Objectives: The Sankaranarayanan–Ramasamy (SR) method is used to create high-quality, transparent ammonium acid phthalate (AAP) single crystals. Their structural, optical, mechanical, and electrical properties are then examined and compared to those of crystals grown using traditional methods. Methods: Using the SR approach, AAP crystals measuring 55 mm in length and 18 mm in diameter were formed from aqueous solution in the <001> direction. Single crystal X-ray diffraction (SCXRD) was used to estimate the unit cell characteristics, indicating an orthorhombic system with space group Pbca. The crystalline perfection was evaluated using high-resolution X-ray diffraction (HRXRD). Z-scan and UV-Vis transmittance spectroscopy were used to analyze optical characteristics. Mechanical property assessments, photoconductivity studies, and laser damage threshold testing were additional characterizations. Findings: HRXRD showed that the SR-grown AAP crystals (12.5") had better crystalline perfection than those that were generated (15”) conventionally. SR-grown crystals had improved 10 % of transparency and nonlinear optical performance, according to optical analysis. These crystals also demonstrated enhanced mechanical strength, enhanced photoconductivity, and greater laser damage thresholds. Novelty: This study demonstrates how well the SR technique produces large, superior AAP single crystals with improved physical characteristics. The SR method's potential for sophisticated optoelectronic and laser applications is highlighted by the comparison with conventionally produced crystals. Keywords: X-ray diffraction, Solution growth technique, High resolution X-ray diffraction, Single crystal X-ray diffraction (SCXRD)