Fundamental Limits of Long Range Fourier Ptychography: On the Importance of Capturing Data in a Snapshot

Fourier ptychography (FP) is a light-based synthetic aperture imaging technique which has achieved remarkable success in high-resolution microscopy applications, where most targets are optically smooth. To date, however, FP has had far less impact in long-range imaging applications, where most targets are optically rough and so introduce speckle noise. This work attempts to characterize the fundamental limits of long range FP. In particular, we prove that if (a) one sequentially captures measures of a fully diffuse targets and (b) the speckle boils sufficiently that each of these measures are independent, then FP is impossible. We then discuss how to overcome this limitation through snapshot imaging techniques.

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Publication Details

Published
2025-06-02
DOI
https://doi.org/10.1109/cisa64343.2025.11091570
Citations
1
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
1.88
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article

Fundamental Limits of Long Range Fourier Ptychography: On the Importance of Capturing Data in a Snapshot

Janith Bandara Senanayaka, Christopher A. Metzler
1 citations
Advanced X-ray Imaging Techniques
1.88
article

Fundamental Limits of Long Range Fourier Ptychography: On the Importance of Capturing Data in a Snapshot

Janith Bandara Senanayaka, Christopher A. Metzler
article en
1 citations

Abstract

Fourier ptychography (FP) is a light-based synthetic aperture imaging technique which has achieved remarkable success in high-resolution microscopy applications, where most targets are optically smooth. To date, however, FP has had far less impact in long-range imaging applications, where most targets are optically rough and so introduce speckle noise. This work attempts to characterize the fundamental limits of long range FP. In particular, we prove that if (a) one sequentially captures measures of a fully diffuse targets and (b) the speckle boils sufficiently that each of these measures are independent, then FP is impossible. We then discuss how to overcome this limitation through snapshot imaging techniques.

University of Maryland, Baltimore (US), University of Maryland, College Park (US)
Openalex Percentile: Top 14%
Advanced X-ray Imaging Techniques
1.88
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