A Study on a Directional Gradient-Based Defect Detection Method for Plate Heat Exchanger Sheets
Micro-crack defects on the surfaces of plate heat exchanger sheets often exhibit a linear grayscale pattern when clustered. In defect detection, traditional methods are more suitable than deep learning models in controlled production environments with limited computing resources to meet stringent national standards, which require low miss rates. However, deep learning models commonly suffer feature loss when detecting individual, small-scale defects, leading to higher leak detection rates. Moreover, in grayscale image line detection using traditional methods, the varying direction, width, and asymmetric grayscale profiles of defects can result in filled grayscale valleys due to width-adaptive smoothing coefficients, complicating accurate defect extraction. To address these issues, this study establishes a theoretical foundation for parameter selection in variable-width defect detection. We propose a directional gradient-based algorithm that mathematically constrains the Gaussian template width to cover variable-width defects with a fixed σ, reframing the detection defect from ridge edges to centrally symmetric double-ridge edges in gradient images. Experimental results show that, when tested in the defective boards library and under simulated factory CPU conditions, this algorithm achieves a miss detection rate of 14.55%, a false detection rate of 21.85%, and an 600 × 600 pixel image detection time of 0.1402 s. Compared to traditional line detection and deep learning object detection methods, this algorithm proves advantageous for detecting micro-crack defects on plate heat exchanger sheets in industrial production, particularly in data-scarce and resource-limited scenarios.
Authors
- Weiqi Yuan (ORCID: https://orcid.org/0000-0002-2412-3318)
- Ding Zhi-Bo (ORCID: https://orcid.org/0000-0001-8237-3836)
Institutions
- Shenyang University of Technology (CN)
Publication Details
- Journal
- Electronics
- Published
- 2025-08-12
- DOI
- https://doi.org/10.3390/electronics14163206
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00