Full vectorial field detection of metasurface devices (Conference Presentation)

Full vectorial field is used to describe the amplitude, phase, and polarization of optical wave, providing a comprehensive representation of the multi-dimensional optical information holding significant importance in the emerging applications of light. Metasurface devices have emerged as groundbreaking platforms for manipulating light waves at subwavelength scales, giving rise to advanced flat optics applications. A critical step toward realizing their full potential lies in accurately characterizing the complete light field of the metasurface devices they impart. Traditional intensity-based techniques offer only partial insights into true optical performance of a metasurface device, often missing crucial phase and polarization information. To address this gap, digital holography provides a powerful, non-invasive solution for reconstructing the full vectorial field with high spatial resolution, enabling the retrieval of multi-dimensional optical information at micro/nano-scale.