High-speed structured light 3D imaging and metrology empowered by deep learning (Conference Presentation)

In this talk, we introduce our recent efforts to apply deep-learning approaches to structured light 3D imaging and metrology, especially Fringe projection profilometry (FPP). We show that the deep-learning-enabled fringe analysis approach can significantly boost the accuracy and improve the quality of the phase reconstruction compared to conventional single-fringe phase retrieval approaches. Deep learning can also be used to achieve single-frame, high-precision, unambiguous 3D shape reconstruction, which is expected to fill the speed “gap” between 3D imaging and 2D sensing and enables FPP techniques to go a step further in high-speed and high-accuracy 3D surface imaging of transient events.

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Publication Details

Published
2025-08-08
DOI
https://doi.org/10.1117/12.3062900
Primary Topic
Optical measurement and interference techniques
Type
article
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article

High-speed structured light 3D imaging and metrology empowered by deep learning (Conference Presentation)

Chao Zuo
Optical measurement and interference techniques
article

High-speed structured light 3D imaging and metrology empowered by deep learning (Conference Presentation)

Chao Zuo
article en

Abstract

In this talk, we introduce our recent efforts to apply deep-learning approaches to structured light 3D imaging and metrology, especially Fringe projection profilometry (FPP). We show that the deep-learning-enabled fringe analysis approach can significantly boost the accuracy and improve the quality of the phase reconstruction compared to conventional single-fringe phase retrieval approaches. Deep learning can also be used to achieve single-frame, high-precision, unambiguous 3D shape reconstruction, which is expected to fill the speed “gap” between 3D imaging and 2D sensing and enables FPP techniques to go a step further in high-speed and high-accuracy 3D surface imaging of transient events.

Nanjing University of Science and Technology (CN)
Openalex Percentile: Top 81%
Optical measurement and interference techniques
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